报告摘要：

　　 2D systems can not only have physical properties distinct from those of 3D materials but also allow control/manipulation of their properties through stacking. For example, Mott insulating and superconducting states, unavailable in single layer graphene, are realized in twisted bilayer graphene. While these novel 2D systems are mostly obtained through exfoliation of van der Waals materials, a more conventional approach through thin film growth. In this presentation, I wish to introduce our research efforts to measure and manipulate electronic properties of a few unit-cell (uc) thick thin films including SrRuO₃, SrIrO₃ and (La,Sr)₂CuO₄using thin film growth and in situ angle resolved photoemission (ARPES). 

报告人简介：

　　 Prof. Kim received his Ph.D. in Applied Physics from Stanford University. After working at SSRL as a staff member, he took a faculty position at Yonsei University in the department of Physics. He moved to Seoul National University as a professor in the department of Physics and Astronomy as well as an associate director of the center for correlated electron systems.